Fault detection and isolation for nonlinear F16 models using A gain-varying UIO approach
10.1109/ICCA.2009.5410624
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Main Authors: | Xu, J., Lum, K.Y., Loh, A.P. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70315 |
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Institution: | National University of Singapore |
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