Fault detection and isolation for nonlinear F16 models using A gain-varying UIO approach

10.1109/ICCA.2009.5410624

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Bibliographic Details
Main Authors: Xu, J., Lum, K.Y., Loh, A.P.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70315
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Institution: National University of Singapore

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