Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing

10.1116/1.3117354

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Bibliographic Details
Main Authors: Chua, H.T., Tay, A., Wang, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70618
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-706182023-10-31T07:17:17Z Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing Chua, H.T. Tay, A. Wang, Y. ELECTRICAL & COMPUTER ENGINEERING 10.1116/1.3117354 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 27 3 1211-1214 JVTBD 2014-06-19T03:14:13Z 2014-06-19T03:14:13Z 2009 Conference Paper Chua, H.T., Tay, A., Wang, Y. (2009). Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 27 (3) : 1211-1214. ScholarBank@NUS Repository. https://doi.org/10.1116/1.3117354 10711023 http://scholarbank.nus.edu.sg/handle/10635/70618 000266500300036 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1116/1.3117354
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Chua, H.T.
Tay, A.
Wang, Y.
format Conference or Workshop Item
author Chua, H.T.
Tay, A.
Wang, Y.
spellingShingle Chua, H.T.
Tay, A.
Wang, Y.
Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
author_sort Chua, H.T.
title Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
title_short Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
title_full Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
title_fullStr Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
title_full_unstemmed Integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
title_sort integrated bake/chill system for across-wafer temperature uniformity control in photoresist processing
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/70618
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