Minority carrier lifetime measurement based on Low frequency fluctuation

Minority carrier lifetime measurement based on Low frequency fluctuation

Materials Research Society Symposium Proceedings

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Bibliographic Details
Main Authors: Lin, K., Sha, H., Jin, C.S., Cheng, L.S., Dolmanan, S.B.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70952
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Institution: National University of Singapore
Description
Summary:Materials Research Society Symposium Proceedings

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