Minority carrier lifetime measurement based on Low frequency fluctuation

• Main Authors: Lin, K., Sha, H., Jin, C.S., Cheng, L.S., Dolmanan, S.B.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70952
• Institution: National University of Singapore

Materials Research Society Symposium Proceedings