Minority carrier lifetime measurement based on Low frequency fluctuation
Materials Research Society Symposium Proceedings
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Main Authors: | Lin, K., Sha, H., Jin, C.S., Cheng, L.S., Dolmanan, S.B. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70952 |
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Institution: | National University of Singapore |
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