Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

• Main Authors: Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Conference or Workshop Item
• 出版: 2014
• 主題: Double lock-in; Localized temperature; Scanning thermal microscopy
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/71609

10.1109/IRPS.2009.5173354