Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy
Conference Proceedings from the International Symposium for Testing and Failure Analysis
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sg-nus-scholar.10635-718992015-01-07T22:18:17Z Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy Meng, L. Street, A.G. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 27-32 2014-06-19T03:29:06Z 2014-06-19T03:29:06Z 2009 Conference Paper Meng, L.,Street, A.G.,Phang, J.C.H. (2009). Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 27-32. ScholarBank@NUS Repository. 9781615030088 http://scholarbank.nus.edu.sg/handle/10635/71899 NOT_IN_WOS Scopus |
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Conference Proceedings from the International Symposium for Testing and Failure Analysis |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Meng, L. Street, A.G. Phang, J.C.H. |
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Conference or Workshop Item |
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Meng, L. Street, A.G. Phang, J.C.H. |
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Meng, L. Street, A.G. Phang, J.C.H. Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
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Meng, L. |
title |
Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
title_short |
Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
title_full |
Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
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Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
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Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
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subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/71899 |
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