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Reliability prediction through degradation data modeling using a quasi-likelihood approach

Proceedings - Annual Reliability and Maintainability Symposium

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書目詳細資料
Main Authors: Jayaram, J.S.R., Girish, T.
其他作者: INDUSTRIAL & SYSTEMS ENGINEERING
格式: Conference or Workshop Item
出版: 2014
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在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/72394
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機構: National University of Singapore