Reliability prediction through degradation data modeling using a quasi-likelihood approach
Proceedings - Annual Reliability and Maintainability Symposium
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Main Authors: | Jayaram, J.S.R., Girish, T. |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72394 |
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Institution: | National University of Singapore |
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