Reliability prediction through degradation data modeling using a quasi-likelihood approach

Reliability prediction through degradation data modeling using a quasi-likelihood approach

Proceedings - Annual Reliability and Maintainability Symposium

Saved in:
Bibliographic Details
Main Authors: Jayaram, J.S.R., Girish, T.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Degradation data
Generalized Estimating Equations
Reliability
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72394
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/72394

Similar Items