Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors:	Palaniappan, M., Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72492
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-724922015-01-06T20:06:15Z Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis Palaniappan, M. Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G. ELECTRICAL ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 17-21 2014-06-19T05:08:40Z 2014-06-19T05:08:40Z 2000 Conference Paper Palaniappan, M.,Chin, J.M.,Phang, J.C.H.,Chan, D.S.H.,Soh, C.E.,Gilfeather, G. (2000). Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 17-21. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72492 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Conference Proceedings from the International Symposium for Testing and Failure Analysis
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Palaniappan, M. Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G.
format	Conference or Workshop Item
author	Palaniappan, M. Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G.
spellingShingle	Palaniappan, M. Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G. Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis
author_sort	Palaniappan, M.
title	Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis
title_short	Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis
title_full	Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis
title_fullStr	Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis
title_full_unstemmed	Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis
title_sort	application of single contact optical beam induced currents (scobic) for backside failure analysis
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72492
_version_	1681087575705518080

Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis

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