Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors:	Palaniappan, M., Ng, V., Heiderhoff, R., Phang, J.C.H., Fiege, G.B.M., Balk, L.J.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72547
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-72547
record_format	dspace
spelling	sg-nus-scholar.10635-725472024-11-14T21:23:34Z Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS Palaniappan, M. Ng, V. Heiderhoff, R. Phang, J.C.H. Fiege, G.B.M. Balk, L.J. ELECTRICAL ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 465-470 2014-06-19T05:09:17Z 2014-06-19T05:09:17Z 1999 Conference Paper Palaniappan, M.,Ng, V.,Heiderhoff, R.,Phang, J.C.H.,Fiege, G.B.M.,Balk, L.J. (1999). Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 465-470. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72547 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Conference Proceedings from the International Symposium for Testing and Failure Analysis
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Palaniappan, M. Ng, V. Heiderhoff, R. Phang, J.C.H. Fiege, G.B.M. Balk, L.J.
format	Conference or Workshop Item
author	Palaniappan, M. Ng, V. Heiderhoff, R. Phang, J.C.H. Fiege, G.B.M. Balk, L.J.
spellingShingle	Palaniappan, M. Ng, V. Heiderhoff, R. Phang, J.C.H. Fiege, G.B.M. Balk, L.J. Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
author_sort	Palaniappan, M.
title	Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
title_short	Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
title_full	Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
title_fullStr	Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
title_full_unstemmed	Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS
title_sort	correlation of electronic and thermal properties of short channel nmosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72547
_version_	1821227411314835456

Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS

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