Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS

Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors: Palaniappan, M., Ng, V., Heiderhoff, R., Phang, J.C.H., Fiege, G.B.M., Balk, L.J.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72547
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/72547

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