Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-725822015-03-03T22:05:07Z Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure Jie, B.B. Li, M.F. Lou, C.L. Lo, K.F. Chim, W.K. Chan, D.S.H. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 176-181 00234 2014-06-19T05:09:41Z 2014-06-19T05:09:41Z 1997 Conference Paper Jie, B.B.,Li, M.F.,Lou, C.L.,Lo, K.F.,Chim, W.K.,Chan, D.S.H. (1997). Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure. Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA : 176-181. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72582 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Jie, B.B. Li, M.F. Lou, C.L. Lo, K.F. Chim, W.K. Chan, D.S.H. |
| format |
Conference or Workshop Item |
| author |
Jie, B.B. Li, M.F. Lou, C.L. Lo, K.F. Chim, W.K. Chan, D.S.H. |
| spellingShingle |
Jie, B.B. Li, M.F. Lou, C.L. Lo, K.F. Chim, W.K. Chan, D.S.H. Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure |
| author_sort |
Jie, B.B. |
| title |
Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure |
| title_short |
Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure |
| title_full |
Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure |
| title_fullStr |
Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure |
| title_full_unstemmed |
Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structure |
| title_sort |
direct-current measurements of interface traps and oxide charges in ldd pmosfets with an n-well structure |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72582 |
| _version_ |
1681087591876657152 |