Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

10.1117/12.405371

Saved in:

書目詳細資料
Main Authors:	Zhang, Z., Tan, L.S., Koh, S.M., Liu, H.M., Flottmann, D.
其他作者:	ELECTRICAL ENGINEERING
格式:	Conference or Workshop Item
出版:	2014
主題:	Laser-microwave photoconductance decay Minority carrier diffusion length Surface photovoltage
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/72597
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

實物特徵
總結:	10.1117/12.405371

相似書籍