Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

10.1117/12.405371

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Bibliographic Details
Main Authors: Zhang, Z., Tan, L.S., Koh, S.M., Liu, H.M., Flottmann, D.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Laser-microwave photoconductance decay
Minority carrier diffusion length
Surface photovoltage
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72597
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Institution: National University of Singapore

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