Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

10.1117/12.405371

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Bibliographic Details
Main Authors:	Zhang, Z., Tan, L.S., Koh, S.M., Liu, H.M., Flottmann, D.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Laser-microwave photoconductance decay Minority carrier diffusion length Surface photovoltage
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72597
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-72597
record_format	dspace
spelling	sg-nus-scholar.10635-725972023-10-30T10:11:06Z Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique Zhang, Z. Tan, L.S. Koh, S.M. Liu, H.M. Flottmann, D. ELECTRICAL ENGINEERING Laser-microwave photoconductance decay Minority carrier diffusion length Surface photovoltage 10.1117/12.405371 Proceedings of SPIE - The International Society for Optical Engineering 4227 66-71 PSISD 2014-06-19T05:09:51Z 2014-06-19T05:09:51Z 2000 Conference Paper Zhang, Z., Tan, L.S., Koh, S.M., Liu, H.M., Flottmann, D. (2000). Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique. Proceedings of SPIE - The International Society for Optical Engineering 4227 : 66-71. ScholarBank@NUS Repository. https://doi.org/10.1117/12.405371 0277786X http://scholarbank.nus.edu.sg/handle/10635/72597 000167995300013 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Laser-microwave photoconductance decay Minority carrier diffusion length Surface photovoltage
spellingShingle	Laser-microwave photoconductance decay Minority carrier diffusion length Surface photovoltage Zhang, Z. Tan, L.S. Koh, S.M. Liu, H.M. Flottmann, D. Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
description	10.1117/12.405371
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Zhang, Z. Tan, L.S. Koh, S.M. Liu, H.M. Flottmann, D.
format	Conference or Workshop Item
author	Zhang, Z. Tan, L.S. Koh, S.M. Liu, H.M. Flottmann, D.
author_sort	Zhang, Z.
title	Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
title_short	Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
title_full	Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
title_fullStr	Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
title_full_unstemmed	Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
title_sort	effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72597
_version_	1781783263282462720

Effect of surface conditions on the measurement of minority carrier diffusion lengths using the surface photovoltage technique

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