Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films

10.1109/20.908917

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書目詳細資料
Main Authors: Leong, S.H., Wang, J.P., Low, T.S.
其他作者: ELECTRICAL ENGINEERING
格式: Conference or Workshop Item
出版: 2014
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在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/72946
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機構: National University of Singapore