Analysis of interfacial delamination in IC packaging: Use stress or fracture mechanics?

10.1109/EPTC.2009.5416480

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Bibliographic Details
Main Authors: Guojun, H., Jing-En, L., Baraton, X., Tay, A.A.O.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73187
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Institution: National University of Singapore