Analysis of interfacial delamination in IC packaging: Use stress or fracture mechanics?
10.1109/EPTC.2009.5416480
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Main Authors: | Guojun, H., Jing-En, L., Baraton, X., Tay, A.A.O. |
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Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73187 |
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Institution: | National University of Singapore |
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