Development of bulk nanostructured copper with superior hardness for use as an interconnect material in electronic packaging

10.1016/j.microrel.2005.06.009

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Bibliographic Details
Main Authors: Pan, M.Y., Gupta, M., Tay, A.A.O., Vaidyanathan, K.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73348
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Institution: National University of Singapore