Development of bulk nanostructured copper with superior hardness for use as an interconnect material in electronic packaging
10.1016/j.microrel.2005.06.009
Saved in:
Main Authors: | Pan, M.Y., Gupta, M., Tay, A.A.O., Vaidyanathan, K. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73348 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Development of bulk nanostructured copper with superior hardness for use as an interconnect material in electronic packaging
by: Gupta, M., et al.
Published: (2014) -
Synthesis and characterization of bulk nanostructured copper for nano wafer level packaging
by: PAN MANYI
Published: (2010) -
An investigation of the synthesis and characterization of copper samples for use in interconnect applications
by: Gupta, M., et al.
Published: (2014) -
Optimization of reliability of copper column flip chip packages with variable compliance interconnects
by: Tay, A.A.O., et al.
Published: (2014) -
A numerical study of fatigue life of copper column interconnections in wafer level packages
by: Sun, W., et al.
Published: (2014)