High frequency characterization of 100 micron pitch wafer level package interconnects
Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
Saved in:
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73503 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Be the first to leave a comment!