Micro-profile measurement of a transparent coating using windowed Fourier transform in white-light vertical scanning interferometry

10.1117/12.970532

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書目詳細資料
Main Authors: Ma, S., Quan, C., Zhu, R., Chen, L.
其他作者: MECHANICAL ENGINEERING
格式: Conference or Workshop Item
出版: 2014
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在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/73612
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