Non-destructive evaluation of MEMS components by optical methods
10.1117/12.839234
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sg-nus-scholar.10635-736822015-02-25T10:06:16Z Non-destructive evaluation of MEMS components by optical methods Tay, C.J. Quan, C. Wang, S.H. MECHANICAL ENGINEERING Mems Micro-beam Non-destructive evaluation Optical fibre White light interferometry 10.1117/12.839234 Proceedings of SPIE - The International Society for Optical Engineering 7375 - PSISD 2014-06-19T05:38:04Z 2014-06-19T05:38:04Z 2009 Conference Paper Tay, C.J.,Quan, C.,Wang, S.H. (2009). Non-destructive evaluation of MEMS components by optical methods. Proceedings of SPIE - The International Society for Optical Engineering 7375 : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1117/12.839234" target="_blank">https://doi.org/10.1117/12.839234</a> 0277786X http://scholarbank.nus.edu.sg/handle/10635/73682 NOT_IN_WOS Scopus |
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Mems Micro-beam Non-destructive evaluation Optical fibre White light interferometry |
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Mems Micro-beam Non-destructive evaluation Optical fibre White light interferometry Tay, C.J. Quan, C. Wang, S.H. Non-destructive evaluation of MEMS components by optical methods |
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10.1117/12.839234 |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Tay, C.J. Quan, C. Wang, S.H. |
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Conference or Workshop Item |
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Tay, C.J. Quan, C. Wang, S.H. |
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Tay, C.J. |
title |
Non-destructive evaluation of MEMS components by optical methods |
title_short |
Non-destructive evaluation of MEMS components by optical methods |
title_full |
Non-destructive evaluation of MEMS components by optical methods |
title_fullStr |
Non-destructive evaluation of MEMS components by optical methods |
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Non-destructive evaluation of MEMS components by optical methods |
title_sort |
non-destructive evaluation of mems components by optical methods |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/73682 |
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