Non-destructive evaluation of MEMS components by optical methods
10.1117/12.839234
Saved in:
Main Authors: | Tay, C.J., Quan, C., Wang, S.H. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73682 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Development of a sensor for layered micro-component measurement using white light interferometry
by: Tay, C.J., et al.
Published: (2014) -
Optical interferometric inspection of surface contour of MEMS-components
by: Tay, C.J., et al.
Published: (2014) -
Evaluation of micro-beam deflection using interferometry
by: Wang, S.H., et al.
Published: (2014) -
Residual stress and profile evaluation on an optical MEMS device
by: Tay, C.J., et al.
Published: (2014) -
Deformation measurement of MEMS components using optical interferometry
by: Wang, S.H., et al.
Published: (2014)