Defect engineering for ultrashallow junctions using surfaces
10.1149/1.2911485
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sg-nus-scholar.10635-745352015-02-28T11:25:44Z Defect engineering for ultrashallow junctions using surfaces Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. CHEMICAL & BIOMOLECULAR ENGINEERING 10.1149/1.2911485 ECS Transactions 13 1 55-62 2014-06-19T06:13:31Z 2014-06-19T06:13:31Z 2008 Conference Paper Seebauer, E.G.,Kwok, C.T.M.,Vaidyanathan, R.,Kondratenko, Y.V.,Yeong, S.H.,Srinivasan, M.P.,Colombeau, B.,Chan, L. (2008). Defect engineering for ultrashallow junctions using surfaces. ECS Transactions 13 (1) : 55-62. ScholarBank@NUS Repository. <a href="https://doi.org/10.1149/1.2911485" target="_blank">https://doi.org/10.1149/1.2911485</a> 9781566776264 19385862 http://scholarbank.nus.edu.sg/handle/10635/74535 NOT_IN_WOS Scopus |
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10.1149/1.2911485 |
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CHEMICAL & BIOMOLECULAR ENGINEERING |
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CHEMICAL & BIOMOLECULAR ENGINEERING Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. |
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Conference or Workshop Item |
author |
Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. |
spellingShingle |
Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. Defect engineering for ultrashallow junctions using surfaces |
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Seebauer, E.G. |
title |
Defect engineering for ultrashallow junctions using surfaces |
title_short |
Defect engineering for ultrashallow junctions using surfaces |
title_full |
Defect engineering for ultrashallow junctions using surfaces |
title_fullStr |
Defect engineering for ultrashallow junctions using surfaces |
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Defect engineering for ultrashallow junctions using surfaces |
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defect engineering for ultrashallow junctions using surfaces |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/74535 |
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1681087946622500864 |