Defect engineering for ultrashallow junctions using surfaces
10.1149/1.2911485
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sg-nus-scholar.10635-745352024-11-10T14:01:02Z Defect engineering for ultrashallow junctions using surfaces Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. CHEMICAL & BIOMOLECULAR ENGINEERING 10.1149/1.2911485 ECS Transactions 13 1 55-62 2014-06-19T06:13:31Z 2014-06-19T06:13:31Z 2008 Conference Paper Seebauer, E.G., Kwok, C.T.M., Vaidyanathan, R., Kondratenko, Y.V., Yeong, S.H., Srinivasan, M.P., Colombeau, B., Chan, L. (2008). Defect engineering for ultrashallow junctions using surfaces. ECS Transactions 13 (1) : 55-62. ScholarBank@NUS Repository. https://doi.org/10.1149/1.2911485 9781566776264 19385862 http://scholarbank.nus.edu.sg/handle/10635/74535 NOT_IN_WOS Scopus |
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10.1149/1.2911485 |
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CHEMICAL & BIOMOLECULAR ENGINEERING |
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CHEMICAL & BIOMOLECULAR ENGINEERING Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. |
format |
Conference or Workshop Item |
author |
Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. |
spellingShingle |
Seebauer, E.G. Kwok, C.T.M. Vaidyanathan, R. Kondratenko, Y.V. Yeong, S.H. Srinivasan, M.P. Colombeau, B. Chan, L. Defect engineering for ultrashallow junctions using surfaces |
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Seebauer, E.G. |
title |
Defect engineering for ultrashallow junctions using surfaces |
title_short |
Defect engineering for ultrashallow junctions using surfaces |
title_full |
Defect engineering for ultrashallow junctions using surfaces |
title_fullStr |
Defect engineering for ultrashallow junctions using surfaces |
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Defect engineering for ultrashallow junctions using surfaces |
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defect engineering for ultrashallow junctions using surfaces |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/74535 |
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1821222865788207104 |