Defect engineering for ultrashallow junctions using surfaces
10.1149/1.2727421
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sg-nus-scholar.10635-745362015-02-02T11:57:17Z Defect engineering for ultrashallow junctions using surfaces Seebauer, E.G. Yeong, S.H. Srinivasan, M.P. Kwok, C.T.M. Vaidyanathan, R. Colombeau, B. Chan, L. CHEMICAL & BIOMOLECULAR ENGINEERING 10.1149/1.2727421 ECS Transactions 6 1 365-371 2014-06-19T06:13:32Z 2014-06-19T06:13:32Z 2007 Conference Paper Seebauer, E.G.,Yeong, S.H.,Srinivasan, M.P.,Kwok, C.T.M.,Vaidyanathan, R.,Colombeau, B.,Chan, L. (2007). Defect engineering for ultrashallow junctions using surfaces. ECS Transactions 6 (1) : 365-371. ScholarBank@NUS Repository. <a href="https://doi.org/10.1149/1.2727421" target="_blank">https://doi.org/10.1149/1.2727421</a> 9781566775502 19385862 http://scholarbank.nus.edu.sg/handle/10635/74536 NOT_IN_WOS Scopus |
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10.1149/1.2727421 |
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CHEMICAL & BIOMOLECULAR ENGINEERING |
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CHEMICAL & BIOMOLECULAR ENGINEERING Seebauer, E.G. Yeong, S.H. Srinivasan, M.P. Kwok, C.T.M. Vaidyanathan, R. Colombeau, B. Chan, L. |
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Conference or Workshop Item |
author |
Seebauer, E.G. Yeong, S.H. Srinivasan, M.P. Kwok, C.T.M. Vaidyanathan, R. Colombeau, B. Chan, L. |
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Seebauer, E.G. Yeong, S.H. Srinivasan, M.P. Kwok, C.T.M. Vaidyanathan, R. Colombeau, B. Chan, L. Defect engineering for ultrashallow junctions using surfaces |
author_sort |
Seebauer, E.G. |
title |
Defect engineering for ultrashallow junctions using surfaces |
title_short |
Defect engineering for ultrashallow junctions using surfaces |
title_full |
Defect engineering for ultrashallow junctions using surfaces |
title_fullStr |
Defect engineering for ultrashallow junctions using surfaces |
title_full_unstemmed |
Defect engineering for ultrashallow junctions using surfaces |
title_sort |
defect engineering for ultrashallow junctions using surfaces |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/74536 |
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1681087946808098816 |