Wirebound deformation during molding of IC packages

American Society of Mechanical Engineers, EEP

Saved in:
Bibliographic Details
Main Authors: Tay, A.A.O., Yeo, K.S., Wu, J.H., Lim, T.B.
Other Authors: INSTITUTE OF MICROELECTRONICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/75099
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore