Effects of high current conduction in sub-micron Ti-silicided films

10.1016/S0038-1101(00)00114-3

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Bibliographic Details
Main Authors:	Gan, C.L., Pey, K.L., Chim, W.K., Siah, S.Y.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80373
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Institution:	National University of Singapore

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