Effects of high current conduction in sub-micron Ti-silicided films
10.1016/S0038-1101(00)00114-3
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Main Authors: | Gan, C.L., Pey, K.L., Chim, W.K., Siah, S.Y. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80373 |
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Institution: | National University of Singapore |
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