Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's
Japanese Journal of Applied Physics, Part 2: Letters
Saved in:
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80382 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-80382 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-803822015-02-20T00:40:47Z Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING Japanese Journal of Applied Physics, Part 2: Letters 35 12 A L1572-L1574 JAPLD 2014-10-07T02:56:55Z 2014-10-07T02:56:55Z 1996-12-01 Article Ang, D.S.,Ling, C.H. (1996-12-01). Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's. Japanese Journal of Applied Physics, Part 2: Letters 35 (12 A) : L1572-L1574. ScholarBank@NUS Repository. 00214922 http://scholarbank.nus.edu.sg/handle/10635/80382 NOT_IN_WOS Scopus |
institution |
National University of Singapore |
building |
NUS Library |
country |
Singapore |
collection |
ScholarBank@NUS |
description |
Japanese Journal of Applied Physics, Part 2: Letters |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H. |
format |
Article |
author |
Ang, D.S. Ling, C.H. |
spellingShingle |
Ang, D.S. Ling, C.H. Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's |
author_sort |
Ang, D.S. |
title |
Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's |
title_short |
Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's |
title_full |
Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's |
title_fullStr |
Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's |
title_full_unstemmed |
Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's |
title_sort |
effects of tungsten polycidation on the hot-carrier degradation in buried-channel ldd p-mosfet's |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/80382 |
_version_ |
1681088877198049280 |