Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's
Japanese Journal of Applied Physics, Part 2: Letters
Saved in:
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80382 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |