Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings
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sg-nus-scholar.10635-804022015-01-07T00:47:36Z Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage Cha, C.L. Chor, E.F. Gong, H. Zhang, A.Q. Dong, Z. Chan, L. ELECTRICAL ENGINEERING MATERIALS SCIENCE International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings 49-52 243 2014-10-07T02:57:09Z 2014-10-07T02:57:09Z 1999 Article Cha, C.L.,Chor, E.F.,Gong, H.,Zhang, A.Q.,Dong, Z.,Chan, L. (1999). Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage. International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings : 49-52. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/80402 NOT_IN_WOS Scopus |
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International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Cha, C.L. Chor, E.F. Gong, H. Zhang, A.Q. Dong, Z. Chan, L. |
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Article |
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Cha, C.L. Chor, E.F. Gong, H. Zhang, A.Q. Dong, Z. Chan, L. |
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Cha, C.L. Chor, E.F. Gong, H. Zhang, A.Q. Dong, Z. Chan, L. Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage |
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Cha, C.L. |
title |
Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage |
title_short |
Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage |
title_full |
Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage |
title_fullStr |
Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage |
title_full_unstemmed |
Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage |
title_sort |
evaluation of rapid thermal nitrided ono interpoly dielectric resistance to plasma process-induced damage |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/80402 |
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