Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage

International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings

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Main Authors: Cha, C.L., Chor, E.F., Gong, H., Zhang, A.Q., Dong, Z., Chan, L.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80402
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-804022024-11-14T00:58:10Z Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage Cha, C.L. Chor, E.F. Gong, H. Zhang, A.Q. Dong, Z. Chan, L. ELECTRICAL ENGINEERING MATERIALS SCIENCE International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings 49-52 243 2014-10-07T02:57:09Z 2014-10-07T02:57:09Z 1999 Article Cha, C.L.,Chor, E.F.,Gong, H.,Zhang, A.Q.,Dong, Z.,Chan, L. (1999). Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage. International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings : 49-52. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/80402 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Cha, C.L.
Chor, E.F.
Gong, H.
Zhang, A.Q.
Dong, Z.
Chan, L.
format Article
author Cha, C.L.
Chor, E.F.
Gong, H.
Zhang, A.Q.
Dong, Z.
Chan, L.
spellingShingle Cha, C.L.
Chor, E.F.
Gong, H.
Zhang, A.Q.
Dong, Z.
Chan, L.
Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
author_sort Cha, C.L.
title Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
title_short Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
title_full Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
title_fullStr Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
title_full_unstemmed Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damage
title_sort evaluation of rapid thermal nitrided ono interpoly dielectric resistance to plasma process-induced damage
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80402
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