Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope

Scanning Microscopy

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Bibliographic Details
Main Authors:	Pey, K.L., Phang, J.C.H., Chan, D.S.H., Balk, L.J., Jakubowicz, A., Bresse, J.F., Myhajlenko, S.
Other Authors:	INSTITUTE OF MICROELECTRONICS
Format:	Article
Published:	2014
Subjects:	Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80632
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-80632
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spelling	sg-nus-scholar.10635-806322015-01-17T16:40:23Z Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S. INSTITUTE OF MICROELECTRONICS ELECTRICAL ENGINEERING Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope Scanning Microscopy 7 4 1195-1206 SCMIE 2014-10-07T02:59:38Z 2014-10-07T02:59:38Z 1993-12 Article Pey, K.L.,Phang, J.C.H.,Chan, D.S.H.,Balk, L.J.,Jakubowicz, A.,Bresse, J.F.,Myhajlenko, S. (1993-12). Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope. Scanning Microscopy 7 (4) : 1195-1206. ScholarBank@NUS Repository. 08917035 http://scholarbank.nus.edu.sg/handle/10635/80632 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope
spellingShingle	Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S. Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
description	Scanning Microscopy
author2	INSTITUTE OF MICROELECTRONICS
author_facet	INSTITUTE OF MICROELECTRONICS Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S.
format	Article
author	Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S.
author_sort	Pey, K.L.
title	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_short	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_full	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_fullStr	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_full_unstemmed	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_sort	investigation of dislocations in gaas using cathodoluminescence in the scanning electron microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80632
_version_	1681088923714977792

Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope

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