Quasi-static and high frequency C-V measurements on Al/Ta2O5/SiO2/Si
Thin Solid Films
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81037 |
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| Institution: | National University of Singapore |
| Summary: | Thin Solid Films |
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