Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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Main Authors:	Osipowicz, T., Sanchez, J.L., Orlić, I., Watt, F., Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81063
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-810632024-11-14T00:58:56Z Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC Osipowicz, T. Sanchez, J.L. Orlić, I. Watt, F. Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. ELECTRICAL ENGINEERING PHYSICS Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 130 1-4 503-506 NIMBE 2014-10-07T03:04:15Z 2014-10-07T03:04:15Z 1997-07 Article Osipowicz, T.,Sanchez, J.L.,Orlić, I.,Watt, F.,Kolachina, S.,Ong, V.K.S.,Chan, D.S.H.,Phang, J.C.H. (1997-07). Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 130 (1-4) : 503-506. ScholarBank@NUS Repository. 0168583X http://scholarbank.nus.edu.sg/handle/10635/81063 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Osipowicz, T. Sanchez, J.L. Orlić, I. Watt, F. Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H.
format	Article
author	Osipowicz, T. Sanchez, J.L. Orlić, I. Watt, F. Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H.
spellingShingle	Osipowicz, T. Sanchez, J.L. Orlić, I. Watt, F. Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
author_sort	Osipowicz, T.
title	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
title_short	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
title_full	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
title_fullStr	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
title_full_unstemmed	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
title_sort	recent results in ion beam induced charge microscopy: unconnected junction contrast and an assessment of single contact ibic
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81063
_version_	1821184445526310912

Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

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