Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
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| Main Authors: | , , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81063 |
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| Institution: | National University of Singapore |