Role of hole fluence in gate oxide breakdown

10.1109/55.798052

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Bibliographic Details
Main Authors:	Li, M.F., He, Y.D., Ma, S.G., Cho, B.-J., Lo, K.F., Xu, M.Z.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81122
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-811222023-10-26T09:10:15Z Role of hole fluence in gate oxide breakdown Li, M.F. He, Y.D. Ma, S.G. Cho, B.-J. Lo, K.F. Xu, M.Z. ELECTRICAL ENGINEERING 10.1109/55.798052 IEEE Electron Device Letters 20 11 586-588 EDLED 2014-10-07T03:04:54Z 2014-10-07T03:04:54Z 1999-11 Article Li, M.F., He, Y.D., Ma, S.G., Cho, B.-J., Lo, K.F., Xu, M.Z. (1999-11). Role of hole fluence in gate oxide breakdown. IEEE Electron Device Letters 20 (11) : 586-588. ScholarBank@NUS Repository. https://doi.org/10.1109/55.798052 07413106 http://scholarbank.nus.edu.sg/handle/10635/81122 000083431700015 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1109/55.798052
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Li, M.F. He, Y.D. Ma, S.G. Cho, B.-J. Lo, K.F. Xu, M.Z.
format	Article
author	Li, M.F. He, Y.D. Ma, S.G. Cho, B.-J. Lo, K.F. Xu, M.Z.
spellingShingle	Li, M.F. He, Y.D. Ma, S.G. Cho, B.-J. Lo, K.F. Xu, M.Z. Role of hole fluence in gate oxide breakdown
author_sort	Li, M.F.
title	Role of hole fluence in gate oxide breakdown
title_short	Role of hole fluence in gate oxide breakdown
title_full	Role of hole fluence in gate oxide breakdown
title_fullStr	Role of hole fluence in gate oxide breakdown
title_full_unstemmed	Role of hole fluence in gate oxide breakdown
title_sort	role of hole fluence in gate oxide breakdown
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81122
_version_	1781783969028636672

Role of hole fluence in gate oxide breakdown

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