Role of hole fluence in gate oxide breakdown

10.1109/55.798052

Saved in:
Bibliographic Details
Main Authors: Li, M.F., He, Y.D., Ma, S.G., Cho, B.-J., Lo, K.F., Xu, M.Z.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81122
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items