Modelling of the "Gated-diode" configuration in bulk MOSFET's

Modelling of the "Gated-diode" configuration in bulk MOSFET's

2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000

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Bibliographic Details
Main Authors: Yip, A., Yeow, Y.T., Samudra, G.S., Ling, C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Gated-diode
Hot-carrier effects
Interface traps
MOSFET
Simulation
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81548
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Institution: National University of Singapore
Description
Summary:2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000

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