Modelling of the "Gated-diode" configuration in bulk MOSFET's
2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000
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2014
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sg-nus-scholar.10635-815482015-01-12T00:11:39Z Modelling of the "Gated-diode" configuration in bulk MOSFET's Yip, A. Yeow, Y.T. Samudra, G.S. Ling, C.H. ELECTRICAL ENGINEERING Gated-diode Hot-carrier effects Interface traps MOSFET Simulation 2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000 360-363 2014-10-07T03:09:29Z 2014-10-07T03:09:29Z 2000 Conference Paper Yip, A.,Yeow, Y.T.,Samudra, G.S.,Ling, C.H. (2000). Modelling of the "Gated-diode" configuration in bulk MOSFET's. 2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000 : 360-363. ScholarBank@NUS Repository. 0966613570 http://scholarbank.nus.edu.sg/handle/10635/81548 NOT_IN_WOS Scopus |
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Gated-diode Hot-carrier effects Interface traps MOSFET Simulation |
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Gated-diode Hot-carrier effects Interface traps MOSFET Simulation Yip, A. Yeow, Y.T. Samudra, G.S. Ling, C.H. Modelling of the "Gated-diode" configuration in bulk MOSFET's |
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2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000 |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING Yip, A. Yeow, Y.T. Samudra, G.S. Ling, C.H. |
format |
Conference or Workshop Item |
author |
Yip, A. Yeow, Y.T. Samudra, G.S. Ling, C.H. |
author_sort |
Yip, A. |
title |
Modelling of the "Gated-diode" configuration in bulk MOSFET's |
title_short |
Modelling of the "Gated-diode" configuration in bulk MOSFET's |
title_full |
Modelling of the "Gated-diode" configuration in bulk MOSFET's |
title_fullStr |
Modelling of the "Gated-diode" configuration in bulk MOSFET's |
title_full_unstemmed |
Modelling of the "Gated-diode" configuration in bulk MOSFET's |
title_sort |
modelling of the "gated-diode" configuration in bulk mosfet's |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/81548 |
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1681089091342434304 |