A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs

10.1109/TED.2008.2010585

Saved in:

Bibliographic Details
Main Authors:	Huang, D., Liu, W.J., Liu, Z.Y., Liao, C.C., Zhang, L.-F., Gan, Z., Wong, W., Li, M.-F.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Charge pumping (CP) Interface traps MOSFETs Negative-bias temperature instability (NBTI) Reaction-diffusion model
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81883
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-81883
record_format	dspace
spelling	sg-nus-scholar.10635-818832023-10-29T22:21:08Z A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs Huang, D. Liu, W.J. Liu, Z.Y. Liao, C.C. Zhang, L.-F. Gan, Z. Wong, W. Li, M.-F. ELECTRICAL & COMPUTER ENGINEERING Charge pumping (CP) Interface traps MOSFETs Negative-bias temperature instability (NBTI) Reaction-diffusion model 10.1109/TED.2008.2010585 IEEE Transactions on Electron Devices 56 2 267-274 IETDA 2014-10-07T04:22:49Z 2014-10-07T04:22:49Z 2009 Article Huang, D., Liu, W.J., Liu, Z.Y., Liao, C.C., Zhang, L.-F., Gan, Z., Wong, W., Li, M.-F. (2009). A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs. IEEE Transactions on Electron Devices 56 (2) : 267-274. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2008.2010585 00189383 http://scholarbank.nus.edu.sg/handle/10635/81883 000262816800016 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Charge pumping (CP) Interface traps MOSFETs Negative-bias temperature instability (NBTI) Reaction-diffusion model
spellingShingle	Charge pumping (CP) Interface traps MOSFETs Negative-bias temperature instability (NBTI) Reaction-diffusion model Huang, D. Liu, W.J. Liu, Z.Y. Liao, C.C. Zhang, L.-F. Gan, Z. Wong, W. Li, M.-F. A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs
description	10.1109/TED.2008.2010585
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Huang, D. Liu, W.J. Liu, Z.Y. Liao, C.C. Zhang, L.-F. Gan, Z. Wong, W. Li, M.-F.
format	Article
author	Huang, D. Liu, W.J. Liu, Z.Y. Liao, C.C. Zhang, L.-F. Gan, Z. Wong, W. Li, M.-F.
author_sort	Huang, D.
title	A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs
title_short	A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs
title_full	A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs
title_fullStr	A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs
title_full_unstemmed	A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs
title_sort	modified charge-pumping method for the cxharacterization of interface-trap generation in mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81883
_version_	1781784006738575360

A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs

Similar Items