A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETs

10.1109/TED.2008.2010585

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Bibliographic Details
Main Authors: Huang, D., Liu, W.J., Liu, Z.Y., Liao, C.C., Zhang, L.-F., Gan, Z., Wong, W., Li, M.-F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/81883
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Institution: National University of Singapore
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