Fermi-level pinning at the interface between metals and nitrogen-doped Ge2 Sb2 Te5 examined by x-ray photoelectron spectroscopy

• Main Authors: Fang, L.W.-W., Zhao, R., Pan, J., Zhang, Z., Shi, L., Chong, T.-C., Yeo, Y.-C.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/82354
• Institution: National University of Singapore

10.1063/1.3263953