First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials

10.1002/pssr.200802152

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Main Authors: Zheng, J.X., Ceder, G., Chim, W.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82364
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-823642023-10-31T07:56:34Z First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials Zheng, J.X. Ceder, G. Chim, W.K. ELECTRICAL & COMPUTER ENGINEERING 10.1002/pssr.200802152 Physica Status Solidi - Rapid Research Letters 2 5 227-229 2014-10-07T04:28:29Z 2014-10-07T04:28:29Z 2008-10 Article Zheng, J.X., Ceder, G., Chim, W.K. (2008-10). First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials. Physica Status Solidi - Rapid Research Letters 2 (5) : 227-229. ScholarBank@NUS Repository. https://doi.org/10.1002/pssr.200802152 18626254 http://scholarbank.nus.edu.sg/handle/10635/82364 000261000600035 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1002/pssr.200802152
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Zheng, J.X.
Ceder, G.
Chim, W.K.
format Article
author Zheng, J.X.
Ceder, G.
Chim, W.K.
spellingShingle Zheng, J.X.
Ceder, G.
Chim, W.K.
First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
author_sort Zheng, J.X.
title First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
title_short First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
title_full First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
title_fullStr First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
title_full_unstemmed First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
title_sort first-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82364
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