First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
10.1002/pssr.200802152
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Main Authors: | Zheng, J.X., Ceder, G., Chim, W.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82364 |
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Institution: | National University of Singapore |
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