Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors

10.1063/1.2198507

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Main Authors: Liu, C., Chor, E.F., Tan, L.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82583
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-825832023-10-26T07:56:07Z Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors Liu, C. Chor, E.F. Tan, L.S. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2198507 Applied Physics Letters 88 17 - APPLA 2014-10-07T04:31:05Z 2014-10-07T04:31:05Z 2006 Article Liu, C., Chor, E.F., Tan, L.S. (2006). Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors. Applied Physics Letters 88 (17) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2198507 00036951 http://scholarbank.nus.edu.sg/handle/10635/82583 000237136600086 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.2198507
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Liu, C.
Chor, E.F.
Tan, L.S.
format Article
author Liu, C.
Chor, E.F.
Tan, L.S.
spellingShingle Liu, C.
Chor, E.F.
Tan, L.S.
Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors
author_sort Liu, C.
title Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors
title_short Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors
title_full Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors
title_fullStr Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors
title_full_unstemmed Investigations of HfO2 AlGaNGaN metal-oxide-semiconductor high electron mobility transistors
title_sort investigations of hfo2 algangan metal-oxide-semiconductor high electron mobility transistors
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82583
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