Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor

10.1063/1.4792477

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Main Authors: Ding, Y., Cheng, R., Du, A., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82613
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-826132023-10-30T08:08:16Z Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor Ding, Y. Cheng, R. Du, A. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.4792477 Journal of Applied Physics 113 7 - JAPIA 2014-10-07T04:31:26Z 2014-10-07T04:31:26Z 2013-02-21 Article Ding, Y., Cheng, R., Du, A., Yeo, Y.-C. (2013-02-21). Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor. Journal of Applied Physics 113 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4792477 00218979 http://scholarbank.nus.edu.sg/handle/10635/82613 000315262800028 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.4792477
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ding, Y.
Cheng, R.
Du, A.
Yeo, Y.-C.
format Article
author Ding, Y.
Cheng, R.
Du, A.
Yeo, Y.-C.
spellingShingle Ding, Y.
Cheng, R.
Du, A.
Yeo, Y.-C.
Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
author_sort Ding, Y.
title Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
title_short Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
title_full Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
title_fullStr Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
title_full_unstemmed Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
title_sort lattice strain analysis of silicon fin field-effect transistor structures wrapped by ge2sb2te5 liner stressor
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82613
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