NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress
10.1109/LED.2009.2024332
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sg-nus-scholar.10635-827452023-10-29T22:29:37Z NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress Liu, B. Tan, K.-M. Yang, M. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING Diamond-like carbon (DLC) Reliability Strain Transistor 10.1109/LED.2009.2024332 IEEE Electron Device Letters 30 8 867-869 EDLED 2014-10-07T04:33:00Z 2014-10-07T04:33:00Z 2009 Article Liu, B., Tan, K.-M., Yang, M., Yeo, Y.-C. (2009). NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress. IEEE Electron Device Letters 30 (8) : 867-869. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2009.2024332 07413106 http://scholarbank.nus.edu.sg/handle/10635/82745 000268342400026 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| topic |
Diamond-like carbon (DLC) Reliability Strain Transistor |
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Diamond-like carbon (DLC) Reliability Strain Transistor Liu, B. Tan, K.-M. Yang, M. Yeo, Y.-C. NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| description |
10.1109/LED.2009.2024332 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Liu, B. Tan, K.-M. Yang, M. Yeo, Y.-C. |
| format |
Article |
| author |
Liu, B. Tan, K.-M. Yang, M. Yeo, Y.-C. |
| author_sort |
Liu, B. |
| title |
NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| title_short |
NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| title_full |
NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| title_fullStr |
NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| title_full_unstemmed |
NBTI reliability of P-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| title_sort |
nbti reliability of p-channel transistors with diamond-like carbon liner having ultrahigh compressive stress |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/82745 |
| _version_ |
1781784212537344000 |